Using Atom-Probe Tomography to Understand ZnO:Al/SiO2/Si Schottky Diodes
Submitted by rjaramil@mit.edu on
"Using Atom-Probe Tomography to Understand ZnO:Al/SiO2/Si Schottky Diodes",
Physical Review Applied, vol. 6, no. 3, pp. 034016, 2016.