Transient terahertz photoconductivity measurements of minority-carrier lifetime in tin sulfide thin films: Advanced metrology for an early stage photovoltaic material

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Jaramillo, R.., M-J. Sher, B. K. Ofori-Okai, V.. Steinmann, C. Yang, K. Hartman, K. A. Nelson, A. M. Lindenberg, R. G. Gordon, and T.. Buonassisi, "Transient terahertz photoconductivity measurements of minority-carrier lifetime in tin sulfide thin films: Advanced metrology for an early stage photovoltaic material", Journal of Applied Physics, vol. 119, issue 3, pp. 035101, 2016/01/21.